Probe station Die probe station AOI testing equipment Exposure machine Sorter
Automatic Epi-Up LED Probing and Testing System
L-915
Automatic Epi-Up LED Probing and Testing System
It can be applied to the photoelectric test of LED WAT formal assembly test in batches
L-915
Automatic Epi-Up LED Probing and Testing System
Compatible with COW and WAT processes, it can meet the automatic sampling test of 4~6-inch full-size LED uncut wafer
Flip LED test system
L-12DM
Flip LED test system
A multi-channel probe card test all-in-one machine applied to full test of chiplet-level LED flipped chips
L-12DM
Flip LED test system
A multi-channel probe card test all-in-one machine applied to full test of chiplet-level LED flipped chips
< 上一页 12
2 pages in total
GO
© 2022 矽电半导体设备（深圳）股份有限公司 版权所有 粤ICP备17016326号      Support:fwwl
weixin
0755-28938875