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Probe station Die probe station AOI testing equipment Exposure machine Sorter

Comprehensive high-precision semi-automatic probe station

Comprehensive high-precision semi-automatic probe station

Suitable for semi-automatic probe testing of 4-8 inch discrete devices, integrated circuits, RF devices, optical chips and other wafers.

Comprehensive high-precision semi-automatic probe station

Suitable for semi-automatic probe testing of 4-8 inch discrete devices, integrated circuits, RF devices, optical chips and other wafers.

12 Inch automatic probe station

12 Inch automatic probe station

The first 12-inch wafer probe station equipment manufacturer in mainland China to achieve industrial application

12 Inch automatic probe station

A probe station with high precision, high rigidity, and high efficiency applied to industrialization at home

8 Inch Automatic Probe Station

8 Inch Automatic Probe Station

Suitable for wafer testing of integrated circuits and power devices of 8 inches and below

8 Inch Automatic Probe Station

Suitable for automatic probe testing of 5~8 inch integrated circuit wafers. The whole machine is specially designed for the test needs of integrated circuit multi-core and multi-probe and high positioning accuracy, which can meet the single-core or multi-core test of less than 2000 probes, and is equipped with a fully automatic loading and unloading system, which has the characteristics of high precision, high rigidity and high stability; Automatic needle alignment improves the alignment accurac

8 inch automatic probe station

8 inch automatic probe station

Suitable for wafer testing of integrated circuits and power devices of 8 inches and below

8 inch automatic probe station

Suitable for automatic probe testing of 5~8 inch integrated circuit wafers. The whole machine is specially designed for the test needs of integrated circuit multi-core and multi-probe and high positioning accuracy, which can meet the single-core or multi-core test of less than 1000 probes, and is equipped with a fully automatic loading and unloading system, which has the characteristics of high precision, high rigidity and high stability. Automatic needle alignment improves the alignment accurac

6 inch Semi-Automatic Probe Station

6 inch Semi-Automatic Probe Station

Suitable for wafer testing of integrated circuits and power devices of 6 inches and below

6 inch Semi-Automatic Probe Station

Suitable for automatic testing of 4, 5 and 6-inch integrated circuits and discrete devices, equipped with CCD vision system, automatic scanning and positioning operation, and truly "one-click testing"

8 inch semi-automatic probe station

8 inch semi-automatic probe station

Suitable for wafer testing of integrated circuits and power devices of 8 inches and below

8 inch semi-automatic probe station

Suitable for automatic testing of 4~8 inch integrated circuits and discrete device wafers. This machine has a variety of flexible testing methods and rich MAPPING processing functions. The product design meets the needs of multi-core and long-needle card testing, and can be equipped with a vision system to achieve automatic scanning and positioning according to the test requirements, and can also be equipped with high temperature and high pressure testing

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