about us
ABOUT
Sidea Semiconductor Equipment (Shenzhen) Co., Ltd.
Sidea Semiconductor Equipment Corporation was founded in 2003 and is a national high-tech enterprise, major in wafer probing and testing technologies products as the leading semiconductor advanced manufacturing equipment supplier from China.
The premium line of products includes probe station, probing and testing system, mapping sorter, AOI system and contact mask aligner. Our solutions delight customers in many applications include, but not limited to discrete semiconductor components, integrated circuits, compound semiconductors, opto-electronic and more.
The innovation and customer demand-oriented, as our core value, is driving the rapid growth of the company. We keep focusing on customer partnership and operational excellence to have broader recognition and sustainable business in the semiconductor industry.
2003
year
Founded
40
%
Proportion of R&D personnel
30+
year
R&D experience of the core team
248
item
Intellectual property
1200
+
Partners
PRODUCTS
PRODUCTS
Focus on the field of semiconductor testing, continue to make breakthroughs and innovations,
and achieve domestic substitution
Probe station Die probe station AOI testing equipment Exposure machine
Comprehensive high-precision semi-automatic probe station
PT-320
Comprehensive high-precision semi-automatic probe station
Suitable for semi-automatic probe testing of 4-8 inch discrete devices, integrated circuits, RF devices, optical chips and other wafers.
PT-320
Comprehensive high-precision semi-automatic probe station
Suitable for semi-automatic probe testing of 4-8 inch discrete devices, integrated circuits, RF devices, optical chips and other wafers.
12 Inch automatic probe station
PT-930
12 Inch automatic probe station
The first 12-inch wafer probe station equipment manufacturer in mainland China to achieve industrial application
PT-930
12 Inch automatic probe station
A probe station with high precision, high rigidity, and high efficiency applied to industrialization at home
8 Inch Automatic Probe Station
PT-9200
8 Inch Automatic Probe Station
Suitable for wafer testing of integrated circuits and power devices of 8 inches and below
PT-9200
8 Inch Automatic Probe Station
Suitable for automatic probe testing of 5~8 inch integrated circuit wafers. The whole machine is specially designed for the test needs of integrated circuit multi-core and multi-probe and high positioning accuracy, which can meet the single-core or multi-core test of less than 2000 probes, and is equipped with a fully automatic loading and unloading system, which has the characteristics of high precision, high rigidity and high stability; Automatic needle alignment improves the alignment accurac
8 inch automatic probe station
PT-920B
8 inch automatic probe station
Suitable for wafer testing of integrated circuits and power devices of 8 inches and below
PT-920B
8 inch automatic probe station
Suitable for automatic probe testing of 5~8 inch integrated circuit wafers. The whole machine is specially designed for the test needs of integrated circuit multi-core and multi-probe and high positioning accuracy, which can meet the single-core or multi-core test of less than 1000 probes, and is equipped with a fully automatic loading and unloading system, which has the characteristics of high precision, high rigidity and high stability. Automatic needle alignment improves the alignment accurac
6 inch Semi-Automatic Probe Station
PT-306
6 inch Semi-Automatic Probe Station
Suitable for wafer testing of integrated circuits and power devices of 6 inches and below
PT-306
6 inch Semi-Automatic Probe Station
Suitable for automatic testing of 4, 5 and 6-inch integrated circuits and discrete devices, equipped with CCD vision system, automatic scanning and positioning operation, and truly "one-click testing"
8 inch semi-automatic probe station
PT-308T
8 inch semi-automatic probe station
Suitable for wafer testing of integrated circuits and power devices of 8 inches and below
PT-308T
8 inch semi-automatic probe station
Suitable for automatic testing of 4~8 inch integrated circuits and discrete device wafers. This machine has a variety of flexible testing methods and rich MAPPING processing functions. The product design meets the needs of multi-core and long-needle card testing, and can be equipped with a vision system to achieve automatic scanning and positioning according to the test requirements, and can also be equipped with high temperature and high pressure testing
Sem-Auto Flip-Chip LED Probing and Testing System
L-11DM-PM
Sem-Auto Flip-Chip LED Probing and Testing System
Flip optoelectronic test system applied to core-level LED chips in batches
L-11DM-PM
Sem-Auto Flip-Chip LED Probing and Testing System
Using patented technology of needle mechanism, equipped with advanced drive mode, high-precision visual positioning system, the test stroke is compatible with 6-inch chips, and can complete the automatic test of 4-inch expansion 1.2 times wafers
Automatic Epi-Up LED Probing and Testing System
L-10MC-W4
Automatic Epi-Up LED Probing and Testing System
It is a full-mounted photoelectric test system that is applied to core-level LED chips in batches, full testing and random testing
L-10MC-W4
Automatic Epi-Up LED Probing and Testing System
It is suitable for the BIN backtest process section after sampling or sorting of large wafers, and can meet the automatic testing of formal 4 and 6-inch LED diced wafers
Automatic Epi-Up LED Probing and Testing System
L-11MC
Automatic Epi-Up LED Probing and Testing System
It is applied to the multi-channel needle card test of the full test of core-level LED full-mounted chips
L-11MC
Automatic Epi-Up LED Probing and Testing System
It is applied to the multi-channel needle card test of the full test of core-level LED full-mounted chips
Automatic Epi-Up LED Probing and Testing System
L-915
Automatic Epi-Up LED Probing and Testing System
It can be applied to the photoelectric test of LED WAT formal assembly test in batches
L-915
Automatic Epi-Up LED Probing and Testing System
Compatible with COW and WAT processes, it can meet the automatic sampling test of 4~6-inch full-size LED uncut wafer
Flip LED test system
L-12DM
Flip LED test system
A multi-channel probe card test all-in-one machine applied to full test of chiplet-level LED flipped chips
L-12DM
Flip LED test system
A multi-channel probe card test all-in-one machine applied to full test of chiplet-level LED flipped chips
Optical communication probe test system
L-9PD
Optical communication probe test system
The integrated design of probe testing provides reliable testing and higher accuracy
L-9PD
Optical communication probe test system
Suitable for the detection of 2~6 inch LED chips and devices
Full-automatic wafer optical microscopy inspection machine
AS-20
Full-automatic wafer optical microscopy inspection machine
Suitable for wafer defect detection before/after dicing, with high motion accuracy, high detection accuracy, and high operating computing power
AS-20
Full-automatic wafer optical microscopy inspection machine
Suitable for cosmetic defect detection of wafer/frame. Equipped with an advanced optical system, equipped with multi-channel light combination inspection, combined with AI algorithm inspection model, it can accurately identify common defects on the wafer surface. The distributed computing system provides ultra-high computing power for detection.
Fully automatic exposure machine
GK-120
Fully automatic exposure machine
This model can be customized according to the needs of diode chip manufacturers to meet the first exposure of 4, 5 and 6 inch wafers
GK-120
Fully automatic exposure machine
This model can be customized according to the needs of diode chip manufacturers to meet the first exposure of 4, 5 and 6 inch wafers
Full-automatic exposure machine
GK-150
Full-automatic exposure machine
It can be customized according to the needs of diode chip manufacturers to meet the first, second and third exposures of 4, 5 and 6-inch Wafer
GK-150
Full-automatic exposure machine
It can be customized according to the process design requirements of diode chip manufacturers to meet the process processing needs of 4-, 5-, and 6-inch wafers for one, two, and three lithography on the same machine. Batch automation design, equipped with four input and output magazines; The double-station parallel meets the simultaneous operation of exposure and alignment.
Automatic chip sorter
SE-A7
Automatic chip sorter
It is widely used in the classification and sorting of LED chips, LED packages, 5G optical chips, PD modules, photosensitive components, and semiconductor chips, and is widely used in the classification and sorting of LED chips, LED packaging bodies, 5G optical chips, PD modules, photosensitive components, and semiconductor chips
SE-A7
Automatic chip sorter
This equipment is classified according to the photoelectric parameters and appearance inspection results obtained by the chip testing machine, and binds the chip to different BIN bearing disks according to the classification results, which can realize the automatic scanning, combining, splicing, classification and automatic loading and unloading of the chip, and generate the data report required for production management, which is widely used in the classification and sorting of LED chips, LED p
Core Benefits
CORE ADVANTAGES
20 years of technology accumulation
Self-developed
Self-developed
20 years of focus on the research and development and innovation of probe testing technology, mastering the core technology of wafer testin
Bulk supply
Bulk supply
Large-scale mass production capacity,fast bulk delivery of FAB
Tailor-made
Tailor-made
Rich field application experience,
mature customized test solutions
Respond quickly
Respond quickly
On-site service during the delivery phase,
24-hour door-to-door
Core Benefits
SOLUTIONS
SOLUTIONS
Customer-centric, solve scenario testing needs, and achieve richer effects
Automated Testing
Automated Testing
More
Semiconductor Test
Semiconductor Test
More
LED Test
LED Test
More
Service support
SERVICE SUPPORT
Quality control
Our company fully implements the ISO9001:2015 quality management system, fully participates in the whole process management of product quality design, quality control, quality assurance and quality improvement, introduces PLM system to manage the stage control of different life cycles of products RD, NPI, MP, strictly controls the whole process of product life cycle, and provides customers with high-quality and high-stability products.
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Equipment Customization
With 20 years' industrial cultivation and profound background, Sidea is a trustworthy domestic brand with professional industrial application in the probe station market. Silicon products have been widely applied to well-known manufacturers for wafer manufacturing, advanced packaging and testing, etc., and Sidea can provide a set of efficient, reliable, sustainable, and stable solutions for enterprises engaged in optoelectronic devices, power devices, discrete devices, and digital-analog mixed chips according to their application and functional requirements.
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After-sales Service
If you have any questions about product purchase, use and maintenance, you can call the national service hotline to contact us, and you will get detailed and satisfactory answers and considerate and thoughtful service.
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NEWS
NEWS
NEWS
We are firm in the direction and move forward with the light
Through continuous exploration and innovation
Use discovery and harvest to achieve supply chain reliability
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