光电芯片

L-10MC-W4

Automatic Epi-Up LED Probing and Testing System

Integrated design of probe test, reliable test, and high accuracy
High-precision four-axis working platform, with test stability and efficiency considered
Unique image processing algorithm, high scanning efficiency, and accurate positioning
Active probe pressure adjustment technology, making probe mark control more reliable
Test band covers ultraviolet (UVC/UVB/UVA), blue, green, yellow, red, and white light, etc. (optional)
A variety of ESD specifications and long ESD service life in the industry (optional)
Support conventional electrical parameters, and optical parameters of various specifications
Support Mini and Microv LED gears

Application fields

LED chip test, LED finished product's module test

Main functions

Different test conditions for the inner circle and the outer circle

Automatic probe cleaning

Automatic alignment and fast scanning and positioning

Real-time display and automatic adjustment of probe pressures by the active edge detector

Automatic probe grinding

Automatically output activation report

Automatic BIN classification of test data

Multi-mapping real-time display

Support connection with MES to automatically load product files

Re-measurement of an NG point

Cavity point positioning (0,0)

Peripheral shrinkage point and shrinkage cavity point

Sampling test of a random point

Sampling test, and then full test

Expansion test, user-defined test, and edge detection test

Sampling test of optical parameters

Different test conditions for different channels

Full test for the outer circle and sampling test for the inner circle

Test applications

non-flipped full LED COT test

sampling test/FQA sampling test

Consultation/Complaint

Question Type

Name

Phone

Telephone

Gender

male

female

Company Name

City

Contact address

Content