Precision optical modules and advanced image algorithms to achieve automatic alignment, automatic needle alignment.

Wafer ID reading support (front/back optional).

The parameters and functions are comparable to the first-class in the world.

Inherit the excellent performance and easy operability of the previous generation of equipment.

Automatic docking of OHT and AGV.

Adapt to the hardware and software connection of the mainstream test system in the market.

Adapt to Hard Docking/Direct Docking/Cable test of various types of test systems.