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Die probe station

AOI testing equipment

Exposure machine

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Semiconductor Test

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PT-306

PT-306

6 inch semi-automatic probe station

Matched with DC probe holders for test, and support installation of 6 probe holders
High-precision CCD vision positioning system with great automation
Optional high-temperature and high voltage test modules, to meet more product test requirements
Optional shading test

Test application

Suitable for wafer testing of integrated circuits and power devices of 6 inch and below

Main functions

Automatic dotting

Automatic wafer alignment

Automatic probe cleaning

Real-time MAP display and product storage

Test application

High-pressure test

High current test

High-temperature test

Re-measurement of an NG point

Shading test

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