Home Products L-D4COW
L-D4COW
L-D4COW
Flip LED test system
Integrated design of probe test, reliable test, and high accuracy
Fully automatic loading and unloading system, supporting double cassette test
Support two positioning methods: flat edge or notch by the wafer
Two products of 4 and 6 inches supported (CHUCK to be replaced)
Accurate chiplet scanning combined with custom test, and accurate positioning
Patented automatic gear identification of an integrating sphere
Active probe pressure adjustment technology, making probe mark control more reliable
Test band covers ultraviolet (UVC/UVB/UVA), blue, green, yellow, red, and white light, etc. (optional)
Current source gear 1.5A@200V
A variety of ESD specifications and long ESD service life in the industry (optional)
Support general electrical parameters, and optical parameters including WLP/WLD/WLC/HW/PURITY/CIE-x/CIE-y/CCT/RA/R1-R15
Support Mini and Microv LED gears
Application field

LED chip testing

Main functions
Sampling test of optical parameters
Different test conditions for different channels
Different test conditions for the inner circle and the outer circle
Full test for the outer circle and sampling test for the inner circle
Multi-mapping real-time display
Automatic regional anomaly retest
Support connection with MES to automatically load product files
Re-measurement of an NG point
Cavity point positioning (0,0)
Peripheral shrinkage point and shrinkage cavity point
Sampling test of a random point
Sampling test, and then full test
Expansion test, user-defined test, and edge detection test
Automatic probe grinding
Automatic alignment and fast scanning and positioning
Automatic BIN classification of test data
Automatically output activation report
Automatic probe cleaning
Real-time display and automatic adjustment of probe pressures by the active edge detector
Test application
WAT test
Automated factory
Support rear automatic line upgrade
Consultation/Complaint
Question Type
Name
Phone
Telephone
Email
Gender
male
female
Company Name
City
Contact address
Content
Related Products
Flip LED testing system
LDM-150-WF
Flip LED testing system
Full- automatic photoelectric testing integrated system that is applied to the flip test of core-level LED chips in batches
LDM-150-WF
Flip LED testing system
Full-automatic photoelectric testing all-in-one machine that is applied to the flip test of core-level LED chips in batches
Sem-Auto Flip-Chip LED Probing and Testing System
L-11DM-PM
Sem-Auto Flip-Chip LED Probing and Testing System
Flip optoelectronic test system applied to core-level LED chips in batches
L-11DM-PM
Sem-Auto Flip-Chip LED Probing and Testing System
Using patented technology of needle mechanism, equipped with advanced drive mode, high-precision visual positioning system, the test stroke is compatible with 6-inch chips, and can complete the automatic test of 4-inch expansion 1.2 times wafers
Flip LED test system
L-12DM
Flip LED test system
A multi-channel probe card test all-in-one machine applied to full test of chiplet-level LED flipped chips
L-12DM
Flip LED test system
A multi-channel probe card test all-in-one machine applied to full test of chiplet-level LED flipped chips
© 2022 矽电半导体设备（深圳）股份有限公司 版权所有 粤ICP备17016326号     Support:fwwl
weixin
0755-28938875