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L-11MC
L-11MC
Automatic Epi-Up LED Probing and Testing System
Integrated design of probe test, reliable test, and high accuracy
High-precision four-axis working platform, stable test, and high efficiency
Unique image processing algorithm, high scanning efficiency, and accurate positioning
Fully automatic probe alignment, making it easier to achieve multi-probe alignment
Probe mark detection
Slice thickness test and automatic flatness adjustment, making the probe contact a chiplet more accurately
The number of test system channels covers 16-core and 32-core (optional)
Support current source gears of multiple specifications and have a long ESD service life in the industry (optional)
Support test of conventional electrical parameters VF/VZ/IF/IR/VFD/DVF
Support Mini and Microv LED gears
Application fields

LED chip testing, LED finished module testing

Main functions
Automatic BIN classification of test data
Re-measurement of an NG point
Support connection with MES to automatically load product files
Automatic probe alignment
Automatic probe mark recognition
Automatic alignment and fast scanning and positioning
Automatic probe cleaning
Automatic probe grinding
Automatically output activation report
Cavity point positioning (0,0)
Automatic regional anomaly retest
Full test for the outer circle and sampling test for the inner circle
Multi-mapping real-time display
Different test conditions for different channels
Different test conditions for the inner circle and the outer circle
Sampling test of optical parameters
Test application
Full test of formal LED COT
Consultation/Complaint
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