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PT-920B

PT-920B

8 inch automatic probe station

High-precision positioning platform (positioning accuracy of ±2 microns)
Meet test of 1,000 probes, used for multi-core simultaneous detection, improving production capacity and benefits
High-precision optical module, combined with the latest image software algorithm, achieving automatic and accurate positioning of probes, and safe and reliable full-automatic test
Unique mechanical arm adsorption technology, solve nondestructive automatic loading and unloading transmission of Taiko\ltrathin\warpage wafers, etc.
CHUCK's modular design, making selection and replacement more convenient and fast

Test application

Suitable for wafer testing of integrated circuits and power devices of 8 inches and below

Main functions

Automatic detection of wafer thickness

Automatic wafer alignment

Automatic probe alignment

CHUCK automatic cleaning

Automatic reading of wafer IDs

Automatic dotting

Probe mark detection

Automatic probe cleaning

Real-time MAP display and product storage

Test application

High-pressure test

Large current test

High-temperature test

Re-measurement of an NG point

Radio frequency test

Special application

Notch-free prealignment

Shading treatment

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