光电芯片测试、发光二极管检测、垂直发射激光器类芯片及器件的检测

L-9PD

Optical communication probe test system

Integrated design of probe test, reliable test, and higher accuracy
High-precision four-axis working platform, with high stability and high efficiency considered
Unique image processing algorithm, high scanning efficiency, and accurate positioning
Active probe pressure adjustment technology, reliable probe mark control
pA-level high-precision current source, fully ensuring test accuracy
Mature light source system (450-1,570nm) covering more devices to be tested
Multiple IV curve scanning logics to improve test efficiency
Heating test (optional)
Support constant parameters and IV-based calculation, covering all PD&APD applications

Application field

Optical communication industry

Main functions

Automatic BIN classification

Support connection with MES to automatically load product files

Automatic regional anomaly retest

Automatically output activation report

Re-measurement of an NG point

Cavity point positioning (0,0)

Multi-mapping real-time display

Dynamically associated test items

Server-side management of product files

Automatic alignment and fast scanning and positioning

Real-time display and automatic adjustment of probe pressures by the active edge detector

Test application

PD wafer Test

APD wafer Test

Consultation/Complaint

Question Type

Name

Phone

Telephone

Gender

male

female

Company Name

City

Contact address

Content