AS-20

Full-automatic wafer optical microscopy inspection machine

Suitable for cosmetic defect detection of wafer/frame. Equipped with an advanced optical system, equipped with multi-channel light combination inspection, combined with AI algorithm inspection model, it can accurately identify common defects on the wafer surface. The distributed computing system provides ultra-high computing power for detection.

SE-A7

Automatic chip sorter

This equipment is classified according to the photoelectric parameters and appearance inspection results obtained by the chip testing machine, and binds the chip to different BIN bearing disks according to the classification results, which can realize the automatic scanning, combining, splicing, classification and automatic loading and unloading of the chip, and generate the data report required for production management, which is widely used in the classification and sorting of LED chips, LED p

GK-150

Full-automatic exposure machine

It can be customized according to the process design requirements of diode chip manufacturers to meet the process processing needs of 4-, 5-, and 6-inch wafers for one, two, and three lithography on the same machine. Batch automation design, equipped with four input and output magazines; The double-station parallel meets the simultaneous operation of exposure and alignment.

PT-930

12 Inch automatic probe station

A probe station with high precision, high rigidity, and high efficiency applied to industrialization at home